Accession Number:

AD0601958

Title:

QUALITY CONTROL MANUAL INSPECTION PROCEDURES FOR SILICON NPN PLANAR EPITAXIAL DEVICE TYPE 2N744.

Descriptive Note:

Item 3

Corporate Author:

TEXAS INSTRUMENTS INC DALLAS

Personal Author(s):

Report Date:

1963-08-15

Pagination or Media Count:

279.0

Abstract:

Descriptors:

• *SEMICONDUCTOR DEVICES
• *SILICON
• QUALITY CONTROL
• QUALITY CONTROL
• TEST METHODS
• TEST EQUIPMENT
• PACKAGING
• SEMICONDUCTORS
• EPITAXIAL GROWTH
• RELIABILITY(ELECTRONICS)
• STANDARDS
• SPECIFICATIONS

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE