REFLECTOMETER FOR DETERMINING OPTICAL CONSTANTS.
NAVAL ORDNANCE LAB CORONA CALIF
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This report describes a reflectometer that uses linearly polarized incident radiation and permits the measurement of the ratio R polarized parallelperpendicular as a function of the angle of incidence, including the minimum ratio corresponding to the pseudo Brewster angle. Special features are 1 the source and detector are mounted in fixed positions and 2 the reflectometer can be mounted in a cryogenic apparatus. It is shown that the resulting data can be reduced to give with precision the pseudo Brewster angle phi sub B or the quantity sq X sub B sq sin phi sub B sq tan phi sub B, as well as the minimum value of R at phi sub B R sub B. With these two parameters, the optical constants can be determined in an analytical manner for a specular sample that can be characterized as having a complex dielectric constant epsilon epsilon sub 1 i epsilon sub 2. Author