LOW TEMPERATURE CATHODES FOR CROSSED-FIELD DEVICES.
Final rept., 5 Jan 62-30 Sep 63,
WESTINGHOUSE ELECTRIC CORP ELMIRA N Y
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A study of the literature dealing with flicker noise in widely different physical systems was made in order to elucidate common features in the current conduction process. The experi mental work was confined to vacuum tubes using a large variety of cathodes including hollow cathode. A very accurate noise measuring instrumentation has been developed which made it possible to study fine grain phenomena of the noise spectra. A statistical model for flicker noise is developed which yields the 1f spectrum and agrees with the experimental results. This model must be considered phenomenological. However, it is shown form experimental evidence that the flicker noise is caused by a course-grained time structure and surface patchiness which is the result of the emitting and current conducting process itself. Experimental work is included on a relatively new cathode - The Barium-Rhenium L-Cathode. Brief discussion is included on the relation between this program and crossed-field noise. Author