Accession Number:

AD0600522

Title:

STUDY OF FAILURE MECHANISMS IN HIGH-POWER RADIO FREQUENCY GENERATING DEVICES.

Descriptive Note:

Technical documentary rept., 30 Oct 63-29 Jan 64.

Corporate Author:

GENERAL TELEPHONE AND ELECTRONICS LABS INC BAYSIDE N Y

Personal Author(s):

• Axler,M. Friedman
• Hein,R. A.

Report Date:

1964-04-01

Pagination or Media Count:

20.0

Abstract:

The aim of the investigation was to determine failure mechanisms caused by residual gases in traveling-wave tubes and to study means of eliminating these gases in order to improve tube reliability. Medium-power X-band amplifiers were life-tested at a high duty factor and evaluated against tubes tested at a lower duty factor a change in tube-processing appears to improve tube performance. Initial electrical and gas data are reported for other tube types. Gas ambient and sorption phenomena for oxide-coated cathode-anode subassemblies under operating conditions are presented. Application of the anode accelerating voltage causes desorption of hydrogen and hydrogenous gases thus, the anode is a major source of hydrogen. Author

Descriptors:

• *ELECTRON TUBE COMPONENTS
• *TRAVELING WAVE TUBES
• RELIABILITY(ELECTRONICS)
• RELIABILITY(ELECTRONICS)
• RADIOFREQUENCY GENERATORS
• GENERATORS
• MICROWAVE EQUIPMENT
• X BAND
• ELECTRODES
• ANODES(ELECTRON TUBES)
• OXIDE CATHODES
• SORPTION
• DEGASIFICATION

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE