DESIGN AND DEVELOPMENT OF SEMICONDUCTOR TEST SET, AN/USM-171.
Quarterly rept. no. 7, 1 Jan-31 Mar 65,
AMERICAN ELECTRONIC LABS INC COLMAR PA
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The ANUSM-171 Study and Design Plan phase delineated the feasibility of the approach for the Beta Measurement and Automatic Lead Selector. The major unknown was in-circuit leakage measurement. During the first quarter, a unique new method of in-circuit leakage measurement was demonstrated. In the second quarter, a 101 improvement in leakage measurement capability was achieved. In the third quarter, development concentrated on the emitter finding and low range leakage measurement circuits. Final fabrication of the in-circuit probe using permanent tooling was accomplished and a value engineering analysis undertaken. During the fourth quarter, the in-circuit emitter finding test circuit was developed and parameter measurement techniques were finalized. During the fifth quarter, emitter finder stop test circuitry and fault finding and indicating circuitry were developed for the Automatic Lead Selector. Verification tests were made on the Measurement Circuits. Mechanical Packaging was accomplished. Automatic PNP-NPN finding and projection readout circuitry for the automatic lead selector were developed. Major progress has been in the development of Automatic Beta Calibration, development of a DC-to-DC converter and in the assembly of the first Advanced Development Model. Author