INFRARED COATING STUDIES.
Quarterly rept. no. 9, 14 Jun-14 Sep 65,
BAUSCH AND LOMB INC ROCHESTER NY RESEARCH AND DEVELOPMENT DIV
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In order to clarify the ambiguity of the refractive indices of some of the filming materials used in the previous reports, efforts were made in this quarter to determine the refractive indices of PbCl2, ZnTe and ZnS films. A computing program was written to calculate film indices as a function of substrate index and the measured quarterwave reflectance or transmittance. From the spectrophotometric measurement of the film-substrate combination, the film index is easily determined as the substrate back surface reflection and is taken into consideration by the computations. Also presented in this report is a collection of the reststrahlen reflectance measurements of three minerals wulfenite, scheelite, and topaz and several crystalline samples SiC, CdS, DdSe, GaP and GaAs. Author