Accession Number:

AD0461486

Title:

STUDY OF EFFECT OF HIGH-INTENSITY PULSED NUCLEAR RADIATION ON ELECTRONIC PARTS AND MATERIALS (SCORRE)

Descriptive Note:

Semiannual progress rept. no. 1, 15 Jun-31 Dec 1964

Corporate Author:

IBM FEDERAL SYSTEMS DIV OWEGO NY ELECTRONICS SYSTEMS CENTER

Personal Author(s):

Report Date:

1965-01-19

Pagination or Media Count:

60.0

Abstract:

Radiation testing of ceramic, glass, tantalum, mica, polystyrene, and mylar capacitors is complete. Data analysis is not complete. New effects were observed when testing glass and tantalum capacitors. Leakage currents in irradiated thin film resistors are principally due to secondary emission and air ionization. No data errors were detected on a magnetic tape that was irradiated. Dosimetry techniques are described, and errors in previous linac dosimetry are discussed. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Radioactivity, Radioactive Wastes and Fission Products

Distribution Statement:

APPROVED FOR PUBLIC RELEASE