Accession Number:

AD0441646

Title:

THIN FILM IMAGE CONVERTER.

Descriptive Note:

Interim technical progress rept. no 4, 24 Jan23 Apr 64,

Corporate Author:

HONEYWELL RESEARCH CENTER HOPKINS MN

Personal Author(s):

• Kruse, Paul W.
• Pribble, Fred C.
• Schulze, Richard G.

Report Date:

1964-05-20

Pagination or Media Count:

46.0

Abstract:

Details of the fabrication and evaluation of a Zn diffused, Te doped GaP diode are presented. The peak of the spectral emission lies at 7700 A at 297 K for a 200 mu amp bias current. With increasing bias the peak shifts to shorter wavelengths. A shift is also observed at 195 K. When operated at 77 K the spectral peak lies at 6600 A, independent of bias current. The relative intensity at 297 K and 195 K is a superlinear function of bias current at low currents. AT 77 K it is a linear function of current at low currents. GaAs on Ge heterojunctions have been prepared by an open tube technique utilizing a close-spaced transport system. Source and substrate are heated by tungsten lamps. X-ray analyses indicate that the initial growth of GaAs is epitaxial, but as deposition progresses a polycrystalline deposit is formed. A literature survey of the optical properties of GaAsxP1-x has been completed. Author

Descriptors:

• *IMAGE INTENSIFIERS(ELECTRONICS)
• METAL FILMS
• ELECTROLUMINESCENCE
• ARSENIC ALLOYS
• GERMANIUM ALLOYS
• GALLIUM ALLOYS
• EPITAXIAL GROWTH
• PHOSPHORUS ALLOYS
• SEMICONDUCTOR DIODES
• LUMINESCENCE
• ABSORPTION

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE