Accession Number:

AD0436711

Title:

PRODUCTION ENGINEERING MEASURES TO INCREASE TRANSISTOR RELIABILITY.

Descriptive Note:

Quarterly progress rept. no. 5, 1 July-30 Sep 63.

Corporate Author:

TEXAS INSTRUMENTS INC DALLAS

Personal Author(s):

Report Date:

1963-09-30

Pagination or Media Count:

27.0

Abstract:

The objective of this effort has been to evaluate and adopt proposed process improvements toward achieving a maximum failure rate of 0.01 per 1,000 hours at a 90 confidence level for the Silicon Triple Diffused Transistor Type 2N656. Test results continue to show that the process improvement work of the subject contract has indeed resulted in a highly reliable planar 2N656 transistor. Eleven hundred production planar devices are being placed on stress tests to confium the attainment of the contract objective. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE