PRODUCTION ENGINEERING MEASURES TO INCREASE TRANSISTOR RELIABILITY.
Quarterly progress rept. no. 5, 1 July-30 Sep 63.
TEXAS INSTRUMENTS INC DALLAS
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The objective of this effort has been to evaluate and adopt proposed process improvements toward achieving a maximum failure rate of 0.01 per 1,000 hours at a 90 confidence level for the Silicon Triple Diffused Transistor Type 2N656. Test results continue to show that the process improvement work of the subject contract has indeed resulted in a highly reliable planar 2N656 transistor. Eleven hundred production planar devices are being placed on stress tests to confium the attainment of the contract objective. Author