Accession Number:
AD0436711
Title:
PRODUCTION ENGINEERING MEASURES TO INCREASE TRANSISTOR RELIABILITY.
Descriptive Note:
Quarterly progress rept. no. 5, 1 July-30 Sep 63.
Corporate Author:
TEXAS INSTRUMENTS INC DALLAS
Personal Author(s):
Report Date:
1963-09-30
Pagination or Media Count:
27.0
Abstract:
The objective of this effort has been to evaluate and adopt proposed process improvements toward achieving a maximum failure rate of 0.01 per 1,000 hours at a 90 confidence level for the Silicon Triple Diffused Transistor Type 2N656. Test results continue to show that the process improvement work of the subject contract has indeed resulted in a highly reliable planar 2N656 transistor. Eleven hundred production planar devices are being placed on stress tests to confium the attainment of the contract objective. Author