Accession Number:

AD0435565

Title:

PRODUCTION ENGINEERING MEASURE RELIABILITY IMPROVEMENT JET ETCH TRANSISTOR.

Descriptive Note:

Quarterly rept. no. 6, 31 July-31 Oct 63,

Corporate Author:

SPRAGUE ELECTRIC CO NORTH ADAMS MASS

Personal Author(s):

• Edwards ,J. N.
• Folster ,J. H. D.
• Gagne ,R. M.
• Ritterbush,L. F.

Report Date:

1963-10-01

Pagination or Media Count:

14.0

Abstract:

It was found that the V subCE method of monitoring delineation was not completely adaptable to production. A new approach was therefore devised, and this approach, which utilizes the value of I sub cbo and shape of the breakdown curve, is described. The problem which led to a temporary increase in failure rate was solved. Data which confirm this solution and which also show the effect to centrifuging the transistors are presented. Author

Descriptors:

• *TRANSISTORS
• MANUFACTURING
• PRODUCTION
• ETCHED CRYSTALS
• CHEMICAL MILLING
• VOLTAGE
• ELECTRIC CURRENT
• ELECTRODES
• RELIABILITY(ELECTRONICS)
• EMBEDDING SUBSTANCES

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE