Accession Number:

AD0435114

Title:

PRODUCTION ENGINEERING MEASURE ON 2N1708 SILICON PLANAR EPITAXIAL TRANSISTOR. VOLUME I.

Descriptive Note:

Final rept. 1 May 62-30 Nov 63,

Corporate Author:

RADIO CORP OF AMERICA SOMERVILLE N J

Personal Author(s):

• Granger,G. F.
• Possemato,L. R.

Report Date:

1963-11-30

Pagination or Media Count:

160.0

Abstract:

A production run was made to demonstrate the reliability achieved as a result of process improvements incorporated into the processing. A summary of the work performed in each of the major processing areas to effect the improvement is described in this report. A program of life testing, analysis of existing life test data and failure analysis was performed concurrently with the work in the processing area. This program included accelerated testing on both storage and operating life tests which lead to the establishment of acceleration curves, the analysis of results on extended life tests, the analysis of failures, and a study of the effect of aging. Author

Descriptors:

• *TRANSISTORS
• SILICON
• ELECTRONIC SWITCHES
• PROCESSING
• PHOTOENGRAVING
• DIFFUSION
• METALLURGY
• WIRE
• GOLD
• ALUMINUM
• PELLETS
• FIXED CONTACTS
• METAL SEALS
• NICKEL
• ENCAPSULATION
• STORAGE
• DISSIPATION
• OPERATION

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE