Accession Number:

AD0431821

Title:

INVESTIGATION OF SECONDARY PHENOMENA FOR USE IN CHECKOUT,

Descriptive Note:

Corporate Author:

SYSTEMS RESEARCH LABS INC DAYTON OHIO

Personal Author(s):

Report Date:

1964-01-01

Pagination or Media Count:

136.0

Abstract:

This report discusses the experimental work, results, and conclusions of the investigation of secondary phenomena for use in checkout of electronic components and circuitry. It consists of a literature survey of the various secondary phenomena generated by operating electronic circuits and the methods of sensing them without direct electrical contact with these circuits. The investigation of physical laws and phenomena, from which suitable subjects for further consideration were selected, was also part of this program. The literature survey was of little assistance in the program as only a limited amount of work had been previously attempted on the effects of secondary phenomena. Different detection techniques of various secondary phenomena were tested experimentally these were x-ray absorption, infrared using a thermistor, infrared using fluorescence, radio-frequency emission, magnetic fields, and electric fields. At present the x-ray absorption, infrared and radio frequency emission show the most promise for future consideration, although these systems will require additional time and effort to develop the techniques and necessary instrumentation. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE