Accession Number:

AD0423900

Title:

INVESTIGATION OF HIGH POWER GASEOUS ELECTRONICS

Descriptive Note:

Quarterly progress rept. no. 3, 16 May-15 Aug 1963,

Corporate Author:

MICROWAVE ASSOCIATES INC BURLINGTON MA

Personal Author(s):

• Maddix, H. S.
• Gregory, J.
• Ward, C. S.

Report Date:

1963-08-15

Pagination or Media Count:

37.0

Abstract:

Clean-up and thermal recovery of inert gases at the interface between a high power microwave discharge and a quartz interface were further investigated. The ion flux to the discharge wall was measured and was found to remain constant during a given clean-up run. The ion flux only varied by a factor of 2 for the five inert gases studied. From the experimental results it is evident that residual impurity gases desorbed from the walls of the clean-up vacuum system significantly affect initial clean-up and recovery behavior.

Descriptors:

• *GASES
• *ELECTRONICS
• ELECTRON DENSITY
• WAVEGUIDES
• MICROWAVES
• RARE GASES
• ELECTRICAL CONDUCTIVITY
• QUARTZ
• PRESSURE
• ELECTRIC DISCHARGES
• IONIC CURRENT
• EXPERIMENTAL DATA
• TEMPERATURE
• IMPURITIES

Subject Categories:

• Physical Chemistry

Distribution Statement:

APPROVED FOR PUBLIC RELEASE