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EFFECT OF LOW GAMMA EXPOSURE RATES ON COMMERCIAL CAPACITORS,
HARRY DIAMOND LABS WASHINGTON D C
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Changes in loss angle and impedance of commercial types of Mylar, paper, ceramic, and wet and dry tantalum capacitors were measured at frequencies ranging from 011 to 100 kc during and after exposure to steady gamma fields at exposure rates up to 1.2 x 10 to the 7th power rhr. The principal objectives were to determine if exposurerate-dependent changes could be extrapolated to the exposure rates 10 to the 7th power rsec encountered in pulse reactors, and to resolve the question of the relative importance of the resistive and capacitive components of the impedance change. Temperature-induced changes in impedance and loss angle due to absorbed radiation tended to obscure the exposure-rate-dependent effects to the extent that extrapolation was too inaccurate for the former purpose. Excluding the effect of temperature, the loss angle of the dry tantalum capacitor at 1 kc was found to be proportional to the exposure rate raised to a power of 0.2 plus or minus 0.1. The effect of exposure rate on the impedance of all samples was smaller than the measurement errors of a few tenths of a percent. Author
APPROVED FOR PUBLIC RELEASE