Accession Number:

AD0423020

Title:

X-RAY DIFFRACTOMETRIC EXAMINATION OF LOW TEMPERATURE PHASE TRANSFORMATIONS IN SINGLECRYSTAL STRONTIUM TITANATE,

Descriptive Note:

Corporate Author:

BOEING SCIENTIFIC RESEARCH LABS SEATTLEWA

Personal Author(s):

• Lytle, Farrel W.

Report Date:

1963-08-01

Pagination or Media Count:

20.0

Abstract:

The lattice parameters of single-crystal strontium titanate were determined by x-ray diffraction as a function of temperature from 4.2 to 300 K. Three significant regions were found. From 65 to 110 K a tetragonal modification exists ca 1.00056, from 35 to 55 K line splitting consistent with orthorhombic symmetry was observed, and at 10 K an anomalous maximum in the lattice parameter vs. temperature curve was found which suggested a third structure transformation. In the tetragonal region at 78 K the formation of a domain structure was observed with a polarizing microscope. The low temperature x-ray technique and x-ray cryostat are described. Author

Descriptors:

• *CRYSTAL LATTICES
• X RAY DIFFRACTION
• SINGLE CRYSTALS
• SINGLE CRYSTALS
• STRONTIUM COMPOUNDS
• TITANATES
• TEMPERATURE
• SYMMETRY(CRYSTALLOGRAPHY)
• TRANSFORMATIONS
• STRUCTURES
• POLARIZATION
• MICROSCOPES
• X RAYS
• CRYSTALS
• PARAMAGNETIC RESONANCE
• PHASE STUDIES

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE