Accession Number:

AD0419995

Title:

CAPACITIVE PROPERTIES OF THIN FILM DEVICES,

Descriptive Note:

Corporate Author:

AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OHIO

Personal Author(s):

Report Date:

1963-08-01

Pagination or Media Count:

89.0

Abstract:

Efforts were directed towards experimentation on the current transfer characteristics of very thin insulating layers. In this investigation a special bridge circuit is used to measure the capacitive properties of evaporated and sputtered thin film diodes. The low voltage limitations and nonlinear properties of the devices were considered in the instrumentation design. The measurements indicated a strong dependence of capacitance on frequency between 1 cps and 100 KCS. An increase in capacitance with DC bias was noted, but only small random variations with changes of signal amplitude. The devices were unstable and changed with both time and DC current. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE