Accession Number:

AD0418026

Title:

SOME SPECIALIZED ATTACHMENTS FOR THE SIEMENS X-RAY DIFFRACTOMETER.

Descriptive Note:

Rept. for Jan 62-Apr 63,

Corporate Author:

AIR FORCE MATERIALS LAB WRIGHT-PATTERSON AFB OHIO

Personal Author(s):

• Renton,John J.
• Baun,William L.

Report Date:

1963-06-01

Pagination or Media Count:

41.0

Abstract:

Several devices are described which were designed to be used with the Siemens horizontal dif fractometer to accomplish specific tasks required in the basic and applied research programs of the AF Materials Laboratory. Instruments which are shown include a low temperature mount for polycrystalline materials, a low temperature mount for single crystals, a simple fiber mount, a two-circle orienter, a true focusing device after the Seemann-Bohlin geometry, and a pro posed high temperature attachment. Included are typical applications of the devices to illustrate the functions for which the instru ments were designed. Author

Descriptors:

• *X RAY DIFFRACTION CAMERAS
• X RAY DIFFRACTION
• MOUNTS

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE