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SOME SPECIALIZED ATTACHMENTS FOR THE SIEMENS X-RAY DIFFRACTOMETER.
Rept. for Jan 62-Apr 63,
AIR FORCE MATERIALS LAB WRIGHT-PATTERSON AFB OHIO
Pagination or Media Count:
Several devices are described which were designed to be used with the Siemens horizontal dif fractometer to accomplish specific tasks required in the basic and applied research programs of the AF Materials Laboratory. Instruments which are shown include a low temperature mount for polycrystalline materials, a low temperature mount for single crystals, a simple fiber mount, a two-circle orienter, a true focusing device after the Seemann-Bohlin geometry, and a pro posed high temperature attachment. Included are typical applications of the devices to illustrate the functions for which the instru ments were designed. Author
APPROVED FOR PUBLIC RELEASE