A DOUBLE COMPOUND THERMAL IMAGING SYSTEM FOR THE DEVELOPMENT OF HIGH-TEMPERATURE ELECTRONIC MATERIALS.
LITTLE (ARTHUR D) INC CAMBRIDGE MASS
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A double compound-reflective thermal imaging system is described which is provided with two 10-kw xenon compace-arc thermal radiant heat sources. Each lamp is capable of irradiating one side of a sample approximately 3 x 5 mm with thermal flux densities up to 1400 wattsquare cm. In comparison with a single compound-reflective thermal imaging system, the double system provides twice the power capacity at the image and is capable of raising the sample temperature by 18 percent. In addition to the 10-kw xenon 5amps, three additional radiant heat sources were tested 1 a heated graphite element 2 a radio-frequency-heated tantalum carbide element and 3 a 2.5 kw xenon compact arc lamp. Instrumentation for measuring the radiant flux density includes 1 a double sided foil radiometer, 2 a total-heat-flux absolute back-body-cavity calorimeter and 3 a photomultiplier-tube radiation probe. Author