Accession Number:

AD0411941

Title:

ELECTRO-INTERFERENCE TEST OF THE CTLI WAFER (MRCN 6301),

Descriptive Note:

Corporate Author:

BOEING CO SEATTLE WASH

Personal Author(s):

Report Date:

1962-09-14

Pagination or Media Count:

1.0

Abstract:

An outline of the test performed on the CTLI Instrumentation Section Wafer and the test results are presented. Pass or fail is determined by 1 whether the test sample meets the specification limit requirements of GM 07-59-2617A for Conducted Generation, Radiated Generation and Antenna Conducted-Transmitter Key down tests, and 2 whether the test sample meets the specification requirements of D2-12411, Vol. II for the monitored critical parameters for all susceptibility tests. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE