FILM THICKNESS CONTROL BY MEANS OF A CRYSTAL RESONATOR
LIBRARY OF CONGRESS WASHINGTON DC AEROSPACE INFORMATION DIV
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The article describes a method of continuous control, by means of a quartz resonator, of the thickness of thin metallic films prepared in a vacuum by evaporation or any other means. The maximum sensitivity of the method is 10 to the -9th power gsq cm. Calibration data are given for a 16-Mc quartz crystal. The method may also be applied to the study of cathode and certain surface phenomena.
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