Accession Number:

AD0408614

Title:

FILM THICKNESS CONTROL BY MEANS OF A CRYSTAL RESONATOR

Descriptive Note:

Corporate Author:

LIBRARY OF CONGRESS WASHINGTON DC AEROSPACE INFORMATION DIV

Personal Author(s):

Report Date:

1963-06-19

Pagination or Media Count:

10.0

Abstract:

The article describes a method of continuous control, by means of a quartz resonator, of the thickness of thin metallic films prepared in a vacuum by evaporation or any other means. The maximum sensitivity of the method is 10 to the -9th power gsq cm. Calibration data are given for a 16-Mc quartz crystal. The method may also be applied to the study of cathode and certain surface phenomena.

Subject Categories:

  • Biological Oceanography

Distribution Statement:

APPROVED FOR PUBLIC RELEASE