BULK RELIABILITY EFFECTS IN SEMICONDUCTOR DEVICES. CURRENT CROWDING IN TRANSISTORS
ARMY ELECTRONICS LABS FORT MONMOUTH NJ
Pagination or Media Count:
The problem of current crowding in transistors is reviewed and its relationship to transistor per formance described. A method is described where by a quantitative value can be assigned as a measure of the extent of crowding that occurs. The possible implications of current crowding in the operational reliability are described. An empirical figure of merit is developed relating the crowding factor to the physical parameters of the semiconductor device. Recommendations in device design are made which should improve the current handling capability of transistors.
- Electrical and Electronic Equipment