RESEARCH AND DEVELOPMENT ON HIGH-POWER CRESTATRONS FOR THE 100-300 MC FREQUENCY RANGE
Quarterly progress rept. no. 11, 1 Jan-1 Apr 1963
MICHIGAN UNIV ANN ARBOR ELECTRON PHYSICS LAB
Pagination or Media Count:
In the electrostatic focusing system employing the P micron 4.46 hollow-beam gun it is shown that a substantial portion of the observed beam interception is due to secondary electrons. One method of reducing this effect is shown. Scaling the P micron 4.46 gun to a value of 20 is de scribed. Two 100-watt Crestatrons were tested at reduced power due to a poor r-f match in the first tube and to high beam interception in the second tube. It is apparent from the data, however, that most of the design objectives have already been easily met. These are a full 3 to 1 band width under small-signal as well as saturation conditions, more than enough small-signal gain and quite encouraging values of conversion efficiency.
- Electrical and Electronic Equipment