Accession Number:

AD0294314

Title:

PEM FOR TRANSISTOR MANUFACTURING PROCESS IMPROVEMENT

Descriptive Note:

Corporate Author:

PHILCO CORP LANSDALE PA

Personal Author(s):

• SANDERS,J.

Report Date:

1962-10-31

Pagination or Media Count:

1.0

Abstract:

The pilot line tra istor w converted from an alloyed collector structure to diffused collector structure. Among the significa t improvem nts which accompany the c ange is a demrature alloys, and lead attachments. Specific changes are reported in the elec rodes and alloys of collector and emitter. The ch nges ave eliminated the open elec rode failure mode on storage and opera ion l s ress. A compoun of boron nitride i silicone fluid is being us d s n ncapsul nt. Wi h this encapsulant the pilot lin strated improvement in collector-b s iode charact ri tics. S ATI FACTORY R SULTS ERE ACHIEVED IN E R S OF IMPROV D PL ING E GE DEFINITION, HIGHER TEMPERATURE ALLOYS, AND LEAD ATTACHMENTS. Specific changes are reported in the elec rodes and alloys of collector and emitter. The ch nges ave eliminated the open elec rode failure mode on storage and opera ion l s ress. A compoun of boron nitride i silicone fluid is being us d s n ncapsul nt. Wi h this encapsulant the pilot line transistor as d mo ra ed power handli g capability 2.5 tim s higher than t at of units ealed in the pro uction encapsulant. The design of the hot sealing oven is complete. Leak testing of all tran istors manufactured on the pilot line has continued using helium bo bing nd t e V eco a s Spectrometer. Data is given on the environmental, storage, opera i g life i g Author

Descriptors:

• *MANUFACTURING
• *TRANSISTORS
• CHEMICAL MILLING
• DEGASIFICATION
• ELECTRODES
• ENCAPSULATION
• HIGH TEMPERATURE
• LIFE EXPECTANCY(SERVICE LIFE)
• OPERATION
• PRODUCTION
• RELIABILITY
• SEALS(STOPPERS)
• STORAGE
• STRESSES

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE