Accession Number:

AD0294110

Title:

PRODUCTION ENGINEERING MEASURE RELIABILITY THRU PROCESS IMPROVEMENT

Descriptive Note:

Corporate Author:

TRW SEMICONDUCTORS INC LAWNDALE CALIF

Personal Author(s):

Report Date:

1962-09-30

Pagination or Media Count:

1.0

Abstract:

Effort is presented on the Production engineering measure to increase transistor reliability. Process improvements within the major tasks of material evaluation, diffusion and photoresist, contact metallizing, lead attachment, and encapsulation were accomplished. Emphasis was placed on the method of contact metallizing and lead attachment. Sample quantities of devices utilizing an evaporated aluminum layer for base and emitter contacts were placed on life test. Equipment was received to begin aluminum wire bonding. Feasibility tests to determine stress levels of the step-stress aging were started. Reliability evaluation of production devices continued to further substantiate the failure rate basis from which the effects of the process improvement tasks will be measured. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE