Accession Number:

AD0292071

Title:

PRODUCTION DEVELOPMENT OF SILICON PLANAR EPITAXIAL TRANSISTOR WITH A MAXIMUM OPERATING FAILURE RATE OF 0.0010/0 PER 1000 HOURS AT A CONFIDENCE LEVEL OF 90( AT 25 C

Descriptive Note:

Corporate Author:

MOTOROLA INC PHOENIX ARIZ

Personal Author(s):

Report Date:

1962-07-31

Pagination or Media Count:

1.0

Abstract:

Effort is made to improve production techniques in order to increase the reliability of silicon planar epitaxial transistor type 2N696 with a maximum operating failure rate of 0.001 per 1000 hours at a 90 confidence level at 25 C. as an objective. The failure rate is an objective, and as a minimum all of the following processes are to be improved toward attaining or exceeding the specified failure rate surface preparation, diffusion processing, epitaxial starting material, wire bonding, metallizing and geometry definition. Author

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Distribution Statement:

APPROVED FOR PUBLIC RELEASE