Accession Number:

AD0291807

Title:

INCREASED ACCURACY CRYSTAL TEST SET

Descriptive Note:

Corporate Author:

SYSTEMS INC ORLANDO FLA

Personal Author(s):

Report Date:

1962-06-01

Pagination or Media Count:

1.0

Abstract:

The results of the development and design of an improved crystal test set covering the frequency range of 0.8 to 20 megacycles are presented. An analysis of the circuit, description of the delivered test sets, and typical test data are also included. The test set is of a Crystal Impedance M ETER Type and includes such features as power setability 0.01 to 1.0 milliwatts, improved accuracy 1 X 10 to the -6th power, and high repeatability 1 X 10 to the -8th power. Other features incorporated into the test set include decade re istance substitution, load capacitance insertion, a precision crystal oven with temperature control, frequency multiplication and an R. F. voltmeter. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE