Combined Environmental Testing of Semiconductor Devices.
Quarterly progress rept. no. 6,
BURROUGHS CORP PHILADELPHIA PA
Pagination or Media Count:
The object of this study is to ascertain whether the combined environmental effects of temperature and pulsed nuclear gamma and neutron radiation on semiconductor devices are simply the sum of the two single effects or a complex interaction of the two, and, to develop a theoretical explanation of the observed phenomena
- Electrical and Electronic Equipment
- Nuclear Weapons