Accession Number:

AD0276987

Title:

EVALUATION OF SILICON METALLIC RECTIFIERS

Descriptive Note:

Corporate Author:

IIT RESEARCH INST CHICAGO ILL

Personal Author(s):

Report Date:

1961-10-31

Pagination or Media Count:

1.0

Abstract:

Type 1N540 rectifiers were subjected to life experiments at different ambient temperatures to determine three points on a curve of operating life versus ambient temperature. Rectifiers were tested at temperatures of 170, 185, and 200 C all units were subjected to 500 milliamperes average forward current and 280 v, 60 c. The tests were continued to 10,000 hours. Considerable differences were observed in the performance of rectifiers from the different manufacturers under given test conditions. The life data were analyzed and plotted to yield the observed reliability functions, and from these estimates the operating life was tabulated for each ambient temperature, at 5 and 50 failure of the test specimens. Few failures were exhibited by the environmental group tested at 170 C, and consequently, its li e data were not very sensitive to evaluation. The operating life at this ambient temperature, for 50 failure, exceeded the 10,000 hr of experimental observation. Author

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Distribution Statement:

APPROVED FOR PUBLIC RELEASE