Accession Number:

AD0276044

Title:

PREDICTION OF CIRCUIT DRIFT MALFUNCTIONS OF SATELLITE SYSTEMS

Descriptive Note:

Corporate Author:

IBM COMMAND CONTROL CENTER FEDERAL SYSTEMS DIV KINGSTON N Y

Personal Author(s):

Report Date:

1962-12-01

Pagination or Media Count:

1.0

Abstract:

Conventional methods for achieving low probability of drift malfunctions in electronic circuits, such as worst-case design, do not provide any measure of the expected circuit degradation during operating life. Statistical analysis techniques are available which permit analytical prediction of probable circuit performance however, these techniques have not achieved wide acceptance, perhaps due to the lack of sufficient evidence which would indicate technique feasibility and accuracy. Three statistical analysis methods were applied to predict various performance characteristics of six typical circuits which are used in transistor electronics. The results were then compared with the measured performance after approximately 2000 hrs. of circuit test operation. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE