Accession Number:

AD0275425

Title:

STUDY OF RADAR ABSORBER MATERIALS

Descriptive Note:

Engineering rept. no. 9, 1 Jan-31 Mar 62,

Corporate Author:

EMERSON AND CUMING INC CANTON MASS

Personal Author(s):

Report Date:

1962-03-31

Pagination or Media Count:

1.0

Abstract:

A microwave interferometer apparatus was used for precision measuring of insertion loss and insertion phase in X-band. Calculations for conversion of the insertion loss and phase data to dielectric constant and loss tangent were made for 14-, 38-, and 12-in.-thick samples of lossy dielectric materials. A typical graph for conversion of the computed data on 38-in.-thick samples up to dielectric constant of 5.0 is included as an initial correlation of the interferometer results with those obtained on a microwave dielectrometer is given. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE