MEASUREMENT OF FIELD STRENGTH ON RESONATOR BOUNDARIES BY THE PERTURBATION OF RADIATION FIELD
MASSACHUSETTS INST OF TECH LEXINGTON LINCOLN LAB
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A new indirect method for measuring the absolute values of the field strength on the boundaries of microwave resonators is presented. This method is based on the perturbation of the radiation field, which can be induced by changing the surface impedance of the resonators conducting boundaries. The method is simple as well as accurate for applications where the other indirect methods, based on the perturbation of the mode-field, fail or become laborious and inaccurate. The perturbation formulas used to calculate the tangential field are simple and were readily derived from the classical theory of propagation of electromagnetic waves in media of high but finite conductivity. The new method was used to determine the distribution of surface current on the boundaries of a klystron re-entrant resonator. Relevant experimental results are presented.
- Operations Research