Accession Number:

AD0271123

Title:

RECRYSTALLIZATION AND GRAIN GROWTH OF ALUMINUM

Descriptive Note:

Corporate Author:

RUTGERS - THE STATE UNIV NEW BRUNSWICK N J

Personal Author(s):

Report Date:

1962-02-01

Pagination or Media Count:

1.0

Abstract:

The dislocation structure of cold-worked highpurity Al and the growth processes in recrystallization were studied by transmission electron microscopy and x-ray diffraction techniques. The dislocation structure of the asymmetrical low-angle boundaries is held responsible for the existence of a long-range stress field and the interconnection between mechanical and thermal stability of these boundaries is shown and related to the recrystallization mechanism. As grain growth proceeds the dislocation density decreases constantly, while the lattice misorientation within the grain increases. It is shown that this increase of misorientation is associated with defects incurred during the growth process and is not due to survivals of defects introduced during the deformation process. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE