Accession Number:

AD0266011

Title:

ANALYSIS OF EXPERIMENTAL RADIATION EFFECTS DATA

Descriptive Note:

Corporate Author:

EDGERTON GERMESHAUSEN AND GRIER INC BOSTON MASS

Personal Author(s):

Report Date:

1961-09-27

Pagination or Media Count:

1.0

Abstract:

A scheme suitable for the automatic machine analysis of the I sub cbo reverse leakage current between base and collector with open emitter data has been devised and is now being coded. A literature search has revealed a method according to which the h sub Fe data forward current transfer data should be analyzed and a great deal of related, pertinent data concerning the radiation damage to transistors, both permanent and transient. This material is briefly summarized. The tran ient effects induced in cables by radiation have been estimated and are believed to be negligible. The distortion of the transistor transients due to reflection of neutrons among the walls is being analyzed. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE