Accession Number:

AD0265870

Title:

MOLECULAR CIRCUIT DEVELOPMENT

Descriptive Note:

Corporate Author:

MELPAR INC FALLS CHURCH VA

Personal Author(s):

• BRYLA,S.M.
• FELDMAN,C.

Report Date:

1961-11-15

Pagination or Media Count:

70.0

Abstract:

Work on the properties of germanium films consisted of studying details of the deposition techniques. Studies of substrate materials, deposition temperatures, deposition times, and annealing temperatures were made. An examination was made of point contacts which represents the beginning of studies on individual microcrystals in the film. In addition to point contact studies, two other types of measurements were added to the program. These were the determination of the thermal band gap of semiconductor films and the study of reflection spectra of dielectric films. The increased effort in dielectric films resulted in a better understanding of the dielectric properties of thin films and the development of pinhole-free dielectric layers capable of operating to 500 C. Author

Descriptors:

• *CIRCUITS
• *DIELECTRIC FILMS
• *DIELECTRIC PROPERTIES
• *THIN FILM STORAGE DEVICES
• CAPACITORS
• GERMANIUM
• MEASUREMENT
• MOLECULAR ELECTRONICS
• PROCESSING
• SEMICONDUCTORS
• SURFACE PROPERTIES
• TEMPERATURE
• VACUUM APPARATUS
• VAPOR PLATING

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE