Accession Number:

AD0263625

Title:

A STUDY OF SEMICONDUCTOR RELIABILITY

Descriptive Note:

Corporate Author:

SYRACUSE UNIV N Y

Personal Author(s):

Report Date:

1961-06-01

Pagination or Media Count:

1.0

Abstract:

A study was undertaken to determine the mechanics of failure of semiconductor devices. A review is given of the physical and statistical basis for failures and failure testing. A review is also presented of the present status of transistor reliability. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE