Accession Number:

AD0261973

Title:

SERVICES, INVESTIGATIONS, AND TESTS ON STANDARD AND NONSTANDARD PARTS AND MATERIALS. TASK 604. RESISTOR-SCREENING TESTS

Descriptive Note:

Corporate Author:

BATTELLE MEMORIAL INST COLUMBUS OHIO

Personal Author(s):

Report Date:

1961-04-30

Pagination or Media Count:

1.0

Abstract:

Screening methods for carbon- and metal-film resistors were investigated. According to literature sources predictive- and stress-type screening are the 2 most prevalent approaches to the problem. Test results indicated that some success could be obtained in screening with the short-time overload-test technique. Stress levels that were prohibitive due to their destructiveness were recognized. After the first 100 to 500 hrs of the accelerated load-life test, when the resistors reach a minimum in resistance and begin to increase in resistance, the test results become more effective. Shorttime overload testing also increases in effectiveness as the resistance changes became more positive. Nondestructive parameters of voltage coefficient and current-noise voltage indicated the need for further development. Changes in the short-time overload test in MIL-R-10509C are recommended.

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE