Accession Number:

AD0258384

Title:

STRUCTURE OF DEFECT CLUSTERS IN SOLIDS

Descriptive Note:

Corporate Author:

IIT RESEARCH INST CHICAGO ILL

Personal Author(s):

Report Date:

1961-05-12

Pagination or Media Count:

1.0

Abstract:

Preliminary results have been achieved on a small angle scattering study of defect clustering in irradiated single crystals. Silicon single crystals irradiated to a total of 2 x 10 to the 19th power nvt fast neutron flux fail to show any small angle scattering. Some small angle x-ray scattering was detected from a lightly irradiated sample of LiF, but preliminary results from a lithium-doped silicon single crystal are negative, even though it was thought to contain 100 A clusters of pure lithium metal. Such clusters should be detectable using small angle x-ray diffraction no conclusive reasons are apparent why this sample did not show small angle scattering. Scattering intensity calculations are treated in an appendix. Author

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Distribution Statement:

APPROVED FOR PUBLIC RELEASE