Accession Number:

AD0258376

Title:

STUDY OF THE MAGNETIZATION OF THIN, EVAPORATED NICKEL FILMS IN A CHANGING ENVIRONMENT

Descriptive Note:

Corporate Author:

GENERAL ELECTRIC CO SCHENECTADY N Y

Personal Author(s):

Report Date:

1961-06-01

Pagination or Media Count:

1.0

Abstract:

The magnetization of Ni films in the thickness range from a few to several hundred angstroms was investigated first under ultrahigh vacuum conditions and then after exposure to an O or H atmosphere at various pressures. Oxidation of the films to a depth of 10 to 15 angstroms takes place in a short time even at pressures of oxygen in the 10 to the -8th power mm range. Exposure to H of initially clean films resulted only in reversible changes of the transverseANISOTROPY CONSTANT. Unusually large increases in the transverse anisotropy of Ni films result when one changes a Ni-vacuum interface to a Ni-Cu interface. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE