Accession Number:

AD0258325

Title:

DESIGN CRITERIA FOR RELIABLE TRANSISTORIZED ASSEMBLIES

Descriptive Note:

Corporate Author:

VITRO LABS WEST ORANGE N J

Personal Author(s):

Report Date:

1960-09-15

Pagination or Media Count:

1.0

Abstract:

Several modifications were made to the previously reported transistor parameter test circuit to enable more accurate measurements. Newly recorded data concerning transistor parameters were programmed for the Bendix G-15 computer. Five transistorized general usage assemblies underwent either minor modification or complete redesign. All changes were dictated by the requirements of assembly specifications, new transistors, or the simplification of parameter tests. The modified assemblies are the audio frequency voltage amplifier, the dual video distribution amplifier, the gated sawtooth generator, the high-level linear amplifier, and the wide band AM detector. All but the highlevel linear amplifier circuit were subjected to parameter variation tests. A detailed discussion of circuit modifications, test procedures, and test results is presented. Author

Descriptors:

• *CIRCUITS
• *TRANSISTOR AMPLIFIERS
• *TRANSISTORS
• MEASUREMENT
• RELIABILITY
• TEST METHODS

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE