Accession Number:

AD0258200

Title:

MAXIMUM PACKING DENSITY OF NON-REDUNDANT SEMICONDUCTOR DEVICES

Descriptive Note:

Corporate Author:

DAVID SARNOFF RESEARCH CENTER PRINCETON N J

Personal Author(s):

Report Date:

1961-03-31

Pagination or Media Count:

1.0

Abstract:

IT IS SHOWN THAT THERE EXISTS AN ABSOLUTE UPPER LIMIT TO PACKING DENSITY OF NON-REDUNDANT SEMICONDUCTOR DEVICES, WHETHER INTEGRATED OR NONINTEGRATED, BASED ON FUNDAMENTAL PHYSICAL PHENOMENA SUCH AS STATISTICAL VARIATIONS IN IMPURITY DISTRIBUTION, MAXIMUM RESOLUTION OF SEMICONDUCTOR FABRICATION METHODS, POWER DENSITY AND INFLUENCE OF COSMIC RAYS. The influence of these phenomena falls into 2 categories, namely, failures that appear during the fabrication of the devices impurity distribution, dividing operation and failures that appear during use. The latter may be temporary failures cosmic ray ionization, carrier fluctuations or permanent failures atomic displacements by cosmic rays, heat generation. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE