Accession Number:

AD0256264

Title:

HANDBOOK OF INSTRUCTIONS FOR TEST SET, DIODE SEMICONDUCTOR DEVICE QRC-133A(T)

Descriptive Note:

Corporate Author:

HALLICRAFTERS CO CHICAGO ILL

Personal Author(s):

Report Date:

1961-05-10

Pagination or Media Count:

1.0

Abstract:

Operation and maintenance instructions are presented for test set, diode semiconductor device QRC-133AT. The test set was developed to enable maintenance personnel to test the forward and inverse voltagecurrent characteristics of diode semiconductor devices. The test set electronically consists of a power transformer with a 115-VAC primary winding and two secondary windings. Also incorporated are 1 a variable transformer that permits increasing or decreasing the diode test voltage, 2 switching circuitry that permits testing diodes with a maximum current handling capability of 1.0 ampere or 10 amperes, 3 a switch that orients the diode for forward or reverse test conditions, 4 a power ON-OFF switch, and 5 an interlock switch that prevents the application of test voltage unless the diode compartment cover is closed. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE