RESEARCH IN FERROMAGNETICS
Annual rept. 1 Sep 59-31 Aug 60.
LABORATORY FOR ELECTRONICS INC BOSTON MA
Pagination or Media Count:
A means of controlling wall motion is reviewed the results of previous experiments on controlled wall motion are re-examined, and a mechanism is proposed to explain the results. Some of the difficulties are described that occur in making measurements to determine the effects of transverse fields on film switching. The use of a 5050 Ni-Fe alloy as a material for controlled wall motion experiments is shown to present certain complications beyond those experienced in using a 8020 Ni-Fe alloy. Films of composition 8020 Ni-Fe were investigated, and for these films and present techniques the limitations to be expected in storage density are determined. Film thickness measuring techniques are reviewed and compared. This work was directed toward producing films of reproducible thickness. A number of refinements are described that were made in the magneto-optic bench equipment and in the thickness-measuring interferometer. Author