Accession Number:

AD0254058

Title:

X-RAY SENSITIVE RECORDING MATERIALS FOR ELECTRON OPTICAL CONTRAST

Descriptive Note:

Corporate Author:

STANFORD UNIV CA MICROWAVE LAB

Personal Author(s):

Report Date:

1961-01-01

Pagination or Media Count:

13.0

Abstract:

The quantitative properties of an X-ray absorption image can be recorded in electron micrographs if t e photographic densities in the EMGs are studied in areas of large dimensions, compared with t e resolution attained, and if the recording material has uniform thickness and a homogeneous or amorphous structure. A thickness corresponding to the reference thickness or a single electron scattering on the average allows the optimum conditions for quantitative evaluation of the image contrast. Good recording materials must have not only radiosensitivity and minimum structure, but also stability in the electron beam. A chemical reaction of the recording material with an electron stain activated by the irradiation is preferable to dissolution processes, which easily produce swelling, especially in the organic materials e.g., polymers, and conse uently can change the distribution of the structural details. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE