Accession Number:

AD0163655

Title:

Method and Apparatus for Obtaining High-Resolution X-Ray Interference Patterns.

Descriptive Note:

Patent,

Corporate Author:

OFFICE OF THE SECRETARY OF THE ARMY WASHINGTON D C

Personal Author(s):

Report Date:

1971-12-21

Pagination or Media Count:

5.0

Abstract:

The invention relates to X-ray interferometers and more particularly to a device and method for the precision measurement of X-ray absorption edges and emission lines in the X-ray spectral region.

Subject Categories:

  • Test Facilities, Equipment and Methods
  • Crystallography

Distribution Statement:

APPROVED FOR PUBLIC RELEASE