Accession Number : ADA423777


Title :   Resonant Enhanced Modulators


Descriptive Note : Final rept. Jun 2000-Jun 2003


Corporate Author : SARNOFF CORP PRINCETON NJ


Personal Author(s) : Abeles, J H ; Lepore, A N ; Kwakernaak, M H ; Mohseni, H ; Pajer, G A


Full Text : https://apps.dtic.mil/dtic/tr/fulltext/u2/a423777.pdf


Report Date : May 2004


Pagination or Media Count : 453


Abstract : We developed fabrication technology, advanced materials and design techniques to realize resonance enhanced modulators with ring-resonators. The devices are based on a lateral geometry with deeply etched waveguides in InP. ICP etching techniques and masks were developed to obtain sub-micrometer deep etched waveguides with nanometer residual sidewall roughness for low optical loss and high quality resonators. Ultra compact multi-mode interference (MMI) couplers are designed and fabricated for coupling of the ring-resonators with superior reproducibility and low excess loss. Design and test procedures were established for ring-resonators and resonance enhanced modulators. We developed three-step quantum wells in GalnAsP/InP for enhanced electro-optic coefficients. Measured electro-optic coefficient of the three-step quantum wells is nearly three times higher than the conventional rectangular quantum well at 1.55 micrometers. The enhanced electro-optic effect, combined with a low optical absorption coefficient alpha1 /cm increases a modulator figure of merit by nearly 36 times, and decreases the power consumption by nearly one order of magnitude compared with a conventional quantum well design. MMI-coupled electro-refractive ring resonators have been fabricated using deeply etched InGaAsP/InP waveguides. We demonstrated the first electro-refractive ring-resonator modulators. RF-modulation with the ring resonator is demonstrated. Resonance enhanced modulation efficiency with the ring-resonance was confirmed.


Descriptors :   *ELECTROOPTICS , *MODULATORS , OPTICAL PROPERTIES , QUANTUM THEORY , TEST METHODS , FABRICATION , LOW LOSS , RECTANGULAR BODIES , INTERFERENCE , ENERGY CONSUMPTION , REPRODUCIBILITY , FIGURE OF MERIT


Subject Categories : Electrooptical and Optoelectronic Devices
      Test Facilities, Equipment and Methods


Distribution Statement : APPROVED FOR PUBLIC RELEASE