Accession Number : ADA286614


Title :   European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (5th)


Descriptive Note : Conference proceedings, 4-7 Oct 1994


Corporate Author : QA REL ASSOCIATES NORTHHAMPTON (UNITED KINGDOM)


Personal Author(s) : Brydon, G M


Full Text : https://apps.dtic.mil/dtic/tr/fulltext/u2/a286614.pdf


Report Date : 07 Oct 1994


Pagination or Media Count : 608


Abstract : The electronic component industry leads the world in the achievement of quality and reliability, whilst at the same time providing products and functionality at steadily reducing prices.


Descriptors :   *RELIABILITY(ELECTRONICS) , *FAILURE(ELECTRONICS) , SYMPOSIA , ELECTROOPTICS , QUANTUM WELLS , THIN FILMS , INTEGRATED CIRCUITS , AVALANCHE EFFECT(ELECTRONICS) , UNITED KINGDOM , PELTIER EFFECT , BREAKDOWN(ELECTRONIC THRESHOLD) , SEMICONDUCTOR DEVICES , FIELD EFFECT TRANSISTORS , MICROELECTRONICS , QUANTUM ELECTRONICS , THERMAL FATIGUE


Subject Categories : Electrical and Electronic Equipment
      Electricity and Magnetism
      Quantum Theory and Relativity


Distribution Statement : APPROVED FOR PUBLIC RELEASE