Accession Number : ADA286328


Title :   European Symposium on X-Ray Topography and High Resolution Diffraction (2nd) Held in Berlin, Germany on 5-7 September 1994. Programme and Abstracts


Corporate Author : BONN UNIV (GERMANY F R)


Full Text : https://apps.dtic.mil/dtic/tr/fulltext/u2/a286328.pdf


Report Date : 07 Sep 1994


Pagination or Media Count : 226


Abstract : Partial Contents: Early experimental proofs of the dynamical theory; Topography in magnetism: domain and phase transition investigations; Diffraction topographic investigations of crystals under applied electric fields; Dependence of defect arrangement in crystals on surface morphology and on conditions of growth from solution; Interaction of slip bands with grain boundaries - observation by white beam SR topography; In-situ X-ray topography studies during the MBE growth process of InGaAs strained layers; Double- and triple-crystal X- ray diffraction analysis of semiconductor quantum wires; Applications in multiple crystal diffractometry; Interpretation of the diffraction profile resulting from strain relaxation in epilayers; Study of thin buried interfaces in III-V compound hetero-structures by high resolution X-ray diffraction


Descriptors :   *X RAY DIFFRACTION , *CRYSTALS , *HIGH RESOLUTION , *TOPOGRAPHY , EUROPE , GEOMAGNETISM , OPTICS , SYMPOSIA , DYNAMICS , WIRE , GALLIUM ARSENIDES , EPITAXIAL GROWTH , ELECTRIC FIELDS , SEMICONDUCTORS , MOLECULAR BEAMS , SURFACES , SILICON , MELTING , X RAY SCATTERING , QUANTUM ELECTRONICS , INDIUM , GRAIN BOUNDARIES , NUCLEAR PHYSICS , DEFECT ANALYSIS , SYNCHROTRONS


Subject Categories : Optics
      Nuclear Physics & Elementary Particle Physics


Distribution Statement : APPROVED FOR PUBLIC RELEASE