Accession Number : ADA279849


Title :   International Symposium on Advanced Laser Technologies Held in Prague, Czech Republic on November 8-13, 1993


Descriptive Note : Conference papers


Corporate Author : CZECH ACADEMY OF SCIENCES PRAGUE INST OF PHYSICS


Personal Author(s) : Boneberg, J ; Bonch-Bruevich, A M ; Mikhailova, G N ; Aksenov, Valerii ; Atanasov, P A ; Barborica, A ; Alekhin, A P ; Dunovsky, Jiri ; Lagutchev, A S ; Maksimov, V V


Full Text : https://apps.dtic.mil/dtic/tr/fulltext/u2/a279849.pdf


Report Date : 13 Nov 1993


Pagination or Media Count : 132


Abstract : Optical reflectivity and transmissivity measurements have been used to investigate the dynamics of melting and recrystallisation of thin films of Si and Ge after laser-annealing with a ns Nd:YAG-laser pulse. We report on temperature dependent changes of the reflectivity of the liquid phase above and below the melting point and on various nucleation and solidification scenarios in thin films, depending on the energy density of the annealing laser.


Descriptors :   *OPTICAL PROPERTIES , *THIN FILMS , *LASER APPLICATIONS , *SEMICONDUCTORS , DIODES , YAG LASERS , TEMPERATURE , NUCLEATION , LASER BEAMS , TRANSMISSIVITY , MELTING POINT , GERMANIUM , REFLECTIVITY , MELTING , SILICON , LIQUID PHASES , PULSES , BEAM SPLITTING , LASERS , SOLIDIFICATION , SYMPOSIA , ANNEALING , DENSITY , MEASUREMENT


Subject Categories : Electrical and Electronic Equipment
      Lasers and Masers
      Optics


Distribution Statement : APPROVED FOR PUBLIC RELEASE