Accession Number : ADA266573


Title :   Sputtered Ferroelectric Thin Films of KTN for Electro-Optic Devices


Descriptive Note : Final rept. 1 Aug 1991-31 May 1993


Corporate Author : TRW INC REDONDO BEACH CA


Personal Author(s) : Sashital, Sanat


Full Text : https://apps.dtic.mil/dtic/tr/fulltext/u2/a266573.pdf


Report Date : May 1993


Pagination or Media Count : 6


Abstract : Major accomplishments of this program are the demonstrations summarized below: (1) Large grain (0.5 to 0.8 micrometer), high preferred orientation (100) films of Pt on SiO2/Si substrates by use of high deposition temperatures (600-650 deg C) with a trace of reactive O2 gas in the rf-PM sputtering gas. The Pt film, besides functioning as metallization for bottom electrodes for capacitors, promotes epitaxial like growth within its large grains and high crystal quality of the overlying KTN film. (2) Epitaxial growth of KTN films on GaAs (100) and 'r' plane' (1012) Sapphire substrates with film normal along 100 polar direction. (3) First time observation of Ferroelectric Curie-Weiss behavior of KTN films by rf-PM sputtering on GaAs and Pt/SiO2/Si substrates with peak dielectric constants of nearly 2250 (at 1 KHz); Sharp Curie transition temperatures (-9 to +3 deg c) with bulk single crystal like characteristics. (4) High optical transmittivity of KTN films on Sapphire with nearly 99.5% of theoretical transmittivity. (5) High quadratic EO effect in paraelectric phase of KTN films on GaAs and Sisubstrates. Observed EO response is nearly 70% larger than for substrates. Observed EO effect is nearly 70% larger than for the same effect in PLZT thin films in ferroelectric phase.... Ferroelectric thin films, Electro-optic devices, Thin films, Platinum films, Sapphire.


Descriptors :   *ELECTROOPTICS , *THIN FILMS , *FERROELECTRIC MATERIALS , OPTICS , SILICON DIOXIDE , FILMS , EPITAXIAL GROWTH , SUBSTRATES , DEPOSITION , RESPONSE , LANTHANUM , BOTTOM , TITANATES , SPUTTERING , TRANSITIONS , PLATINUM , CONSTANTS , SILICON , ELECTRODES , LEAD(METAL) , METALLIZING , CAPACITORS , ZIRCONATES , SAPPHIRE , PHASE , GRAIN SIZE , SINGLE CRYSTALS , DIELECTRICS , GALLIUM ARSENIDES , TEMPERATURE


Subject Categories : Electrooptical and Optoelectronic Devices
      Laminates and Composite Materials
      Crystallography
      Electricity and Magnetism


Distribution Statement : APPROVED FOR PUBLIC RELEASE