Accession Number : ADA265674


Title :   Atomic-Scale Imaging of Surfaces and Interfaces. Materials Research Society Symposium Proceedings Held in Boston, Massachusetts on November 30-December 2, 1992. Volume 295


Corporate Author : MATERIALS RESEARCH SOCIETY PITTSBURGH PA


Personal Author(s) : Biegelsen, David K ; Smith, David J ; Tong, S Y


Full Text : https://apps.dtic.mil/dtic/tr/fulltext/u2/a265674.pdf


Report Date : Jan 1992


Pagination or Media Count : 290


Abstract : The gap between imagining and imaging is getting ever smaller. Atomic-Scale Imaging of Surfaces and Interfaces, Symposium W at the 1992 MRS fall Meeting in Boston, Massachusetts, brought together researchers using most state-of-the-art imaging techniques capable of resolving atomic features. Methods represented were scanning tunneling microscopy (STM), atomic force microscopy (AFM), low energy electron microscopy (LEEM), transmission (TEM) and reflection (REM) electron microscopy, scanning electron microscopy (SEM), atom probe field ion microscopy (APFIM or POSAP), high and low energy external source electron holographies and internal source electron holographies. Some highlights from the STM papers included discussions of the limitations and future potential of STM as well as current findings. Several papers presented work with STM at elevated temperatures. Jene Golovchenko reviewed STM work showing cooperative diffusion events (Pb on Ge) involving many tens of substrate atoms. Don Eigler focused on atomic manipulation and some of its uses to enable fundamental studies of small atomic clusters.


Descriptors :   *INTERFACES , *SURFACES , *IMAGES , *ATOMIC STRUCTURE , SCANNING , EXCITATION , THIN FILMS , CRYSTALS , HIGH RESOLUTION , DEFECTS(MATERIALS) , GRAIN BOUNDARIES , WAVES , STRONTIUM , DESORPTION , ENERGETIC PROPERTIES , INDIUM PHOSPHIDES , TUNNELING , CHARGE DENSITY , NIOBIUM , TITANIUM OXIDES , ULTRAHIGH VACUUM , SILICON , CERAMIC MATERIALS , MICROSCOPY , SEMICONDUCTORS , MOTION , ELECTRON MICROSCOPES , SYMPOSIA


Subject Categories : Physical Chemistry
      Crystallography
      Atomic and Molecular Physics and Spectroscopy
      Optics


Distribution Statement : APPROVED FOR PUBLIC RELEASE